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Contracted services using X-ray residual stress measurement equipment | JTL

Residual stress in the surface layer of the sample is measured non-destructively using a residual stress measurement device.

We will conduct stress measurements on the surface of polycrystalline materials using an X-ray residual stress measurement device. Stress measurement utilizing the principle of X-ray diffraction is widely used in material development and quality evaluation of products. Measurements with this equipment allow for non-destructive, micro-area, high-precision, and quick residual stress assessments. Manufactured by Rigaku AutoMATE ● X-ray tube: Cr tube ● 2θ measurement range: 98° to 168° ● Incident collimator: φ150, 300, 500μm; φ1, 2, 4mm ● Detector: PSPC detector ● Zoom microscope with CCD: ×20 to 135 ● Stage control: with mapping and teaching functions ● Automatic XYZ axis movement range: XY100mm × Z40mm ● Maximum sample space: φ320 × t215mm ● Maximum sample weight: 20kg (10kg during mapping and teaching) ● Analysis software: Residual austenite quantitative calculation Residual austenite mapping display Stress mapping display